Test Type: CTE, Michelson Laser Interferometer, Reference ASTM E289

The PMIC Michelson laser interferometer measures real time thermal expansion/contraction. Each shift in the fringe pattern corresponds to a change in specimen length of one-half the laser wavelength (316 nm (12.456 µ-in) for a He-Ne laser in vacuum).

 

Precision optics, photo detectors and interpolation techniques allow nanometer resolution. This technique uniquely allows a wide range in specimen size and shape. Thin films, plates, sandwich structures and tubes up to 3m long can be tested. Multi-directional strains can be determined simultaneously, e.g., for composite components or structures.

 

Specifications:

Resolution	10 to 50 ppb/ºC
Temperature Range	-160°C (113K) - 725°C (1000K)
Specimen Size	Varied
Control Software	LabView