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The PMIC LV-5 uses quartz and LVDT’s to measure real time thermal expansion/contraction for maximum resolution and accuracy. Minute changes are recorded to offer high resolution down to 0.5 ppm/°C. The system arrangement uniquely allows a wide range of specimen size and shapes along with multiple specimens being tested at the same time. Thin films, plates, sandwich structures, circuit boards, IC chips, and specimens up to 20cm long can be tested. Larger specimen sizes can be accommodated with custom ordering.